
Proceedings Paper
Combination of an optic system and Er:YAG laser in root canal preparation: study in vivo and in vitroFormat | Member Price | Non-Member Price |
---|---|---|
$17.00 | $21.00 |
Paper Abstract
The effect of Er:YAG laser in debris removing after conventional root preparation was tested by optical system in vivo and scanning electron microscope in vitro. The root canal of fifty permanent molars was cleaned in vivo and Er:YAG laser treated. Flexiscope system was used to evaluate the efficacy of laser cleansing at the different stages of endodontic therapy. Forty permanent teeth, extracted for orthodontic or periodontal purposes, were treated in vitro using the same technique an instruments. The in vitro treated teeth were also examined under the SEM. The result of our investigation show an effective improvement of the cleansing of the endodontic surface from pulpal remaining and a smear layer after laser irradiation in vivo and in vitro. The use of Er:YAG laser in organic debris removing and the consequent optical system analysis of the quality of root preparation in vivo seem to be a reliable technique particularly useful in clinical application.
Paper Details
Date Published: 27 April 2001
PDF: 7 pages
Proc. SPIE 4249, Lasers in Dentistry VII, (27 April 2001); doi: 10.1117/12.424497
Published in SPIE Proceedings Vol. 4249:
Lasers in Dentistry VII
Peter Rechmann D.D.S.; Daniel Fried; Thomas Hennig, Editor(s)
PDF: 7 pages
Proc. SPIE 4249, Lasers in Dentistry VII, (27 April 2001); doi: 10.1117/12.424497
Show Author Affiliations
Marina Consuelo Vitale, Univ. of Pavia (Italy)
Annibale Renzo Botticelli, Univ. of Pavia (Italy)
Davide Zaffe, Univ. of Modena and Reggio Emilia (Italy)
Annibale Renzo Botticelli, Univ. of Pavia (Italy)
Davide Zaffe, Univ. of Modena and Reggio Emilia (Italy)
Aurelia Cisternino, Univ. of Pavia (Italy)
Francesco Scarpelli, Consultant (Italy)
Francesco Scarpelli, Consultant (Italy)
Published in SPIE Proceedings Vol. 4249:
Lasers in Dentistry VII
Peter Rechmann D.D.S.; Daniel Fried; Thomas Hennig, Editor(s)
© SPIE. Terms of Use
