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Proceedings Paper

Seal characterization for supernarrow periphery LCD panel
Author(s): Shunji Suzuki; Michikazu Noguchi; Kohichi Miwa; Yoshiharu Fujii; Donald P. Seraphim; Dean Skinner
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Paper Abstract

Control of the seal edge of LC cells with super narrow periphery is very important for the application to compact AM-LCD designs. Several thermal cure epoxy resins have been studied as candidates for LC panel seal materials, with emphasis on characterizing the seal edge. The factors affecting material selection are its effect on LC alignment, the seal edge waviness or straightness, the formation of the seal edge boundary during lamination and cure and finally, its compatibility with standard cell processing techniques. Optimal seal material selection is discussed in view of its application to the design and fabrication of super narrow periphery LC cells. Cell design of seal edge control is also discussed in view of application of seal characterization and structural contribution, including material and process matching.

Paper Details

Date Published: 30 March 2001
PDF: 8 pages
Proc. SPIE 4294, Projection Displays VII, (30 March 2001); doi: 10.1117/12.420779
Show Author Affiliations
Shunji Suzuki, IBM Japan, Ltd. (Japan)
Michikazu Noguchi, IBM Japan, Ltd. (Japan)
Kohichi Miwa, IBM Japan, Ltd. (Japan)
Yoshiharu Fujii, IBM Japan, Ltd. (Japan)
Donald P. Seraphim, Rainbow Displays, Inc. (United States)
Dean Skinner, Rainbow Displays, Inc. (United States)

Published in SPIE Proceedings Vol. 4294:
Projection Displays VII
Ming Hsien Wu, Editor(s)

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