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Proceedings Paper

High-precision surface profiling with broadband accordion fringe interferometry
Author(s): Gary J. Swanson; Matthew P. Kavalauskas; Lyle G. Shirley
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Paper Abstract

Accordion fringe interferometry (AFI) is an active-triangulation, surface-profiling technique based on projecting interference fringes onto the surface ofan object from a source at one location and viewing with a camera at another location. Interference fringes have the advantage of infinite depth of field, which allows large or complex objects to be illuminated without the need for source focus. Conventional AFI produces the interference fringes by using a laser to form two mutually coherent source points. Coherent illumination, however, produces speckle in the image that limits range resolution. A technique that significantly improves the range resolution ofAFI is described and demonstrated experimentally. This technique uses broadband illumination to eliminate speckle effects, while maintaining the advantages of interference-fringe projection.

Paper Details

Date Published: 12 February 2001
PDF: 9 pages
Proc. SPIE 4189, Machine Vision and Three-Dimensional Imaging Systems for Inspection and Metrology, (12 February 2001); doi: 10.1117/12.417193
Show Author Affiliations
Gary J. Swanson, MIT Lincoln Lab. (United States)
Matthew P. Kavalauskas, MIT Lincoln Lab. (United States)
Lyle G. Shirley, MIT Lincoln Lab. (United States)

Published in SPIE Proceedings Vol. 4189:
Machine Vision and Three-Dimensional Imaging Systems for Inspection and Metrology
Kevin G. Harding; John W. V. Miller; Bruce G. Batchelor, Editor(s)

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