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Proceedings Paper

Uncertainty and confidence intervals in optical design using the Monte Carlo ray-trace method
Author(s): Maria Cristina Sanchez; Felix J. Nevarez; J. Robert Mahan; Kory J. Priestley
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Paper Abstract

12 The increasing use of probabilistic methods, such as the Monte Carlo ray-trace (MCRT) method, in thermal radiation and optical modeling, has created a general awareness in the community of the need for a protocol to predict, to a specified level of confidence, the uncertainty of the results obtained using these methods. This paper presents such a protocol applied to models of radiometric channels used in space-based Earth observations. It is anticipated that the same protocol, with suitable modification, may be extended to data from actual instruments. The authors and their colleagues have developed a powerful generic MCRT- based computational environment that, among other features, is capable of simulating radiative exchange among surfaces and within enclosures. As in any MCRT thermal- radiative/optical model, the spatial resolution and accuracy of the results obtained depend on the fineness of the mesh, the number of rays traced, and the accuracy of directional and spectral surface property models. The protocol presented in this paper identifies and quantifies the contribution of these factors to the ultimate uncertainty in predicted results and to their related confidence intervals.

Paper Details

Date Published: 9 February 2001
PDF: 12 pages
Proc. SPIE 4169, Sensors, Systems, and Next-Generation Satellites IV, (9 February 2001); doi: 10.1117/12.417119
Show Author Affiliations
Maria Cristina Sanchez, Virginia Polytechnic Institute and State Univ. (United States)
Felix J. Nevarez, Polytechnic Univ. of Puerto Rico (United States)
J. Robert Mahan, Virginia Polytechnic Institute and State Univ. (United States)
Kory J. Priestley, NASA Langley Research Ctr. (United States)

Published in SPIE Proceedings Vol. 4169:
Sensors, Systems, and Next-Generation Satellites IV
Hiroyuki Fujisada; Joan B. Lurie; Alexander Ropertz; Konradin Weber, Editor(s)

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