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Proceedings Paper

White and blue temperature stable and efficient OLEDs using amorphous spiro transport and spiro emitting compounds
Author(s): Hubert Spreitzer; Horst Vestweber; Philipp Stoessel; Heinrich Becker
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Paper Abstract

The temperature stability of white and blue OLEDs was investigated by observing the I-V, EL-V and the spectral characteristics of various devices stored at elevated temperature (up to 130 degrees Celsius). Blue multilayer organic light emitting diodes (OLEDs) containing PEDT (polyethylenedioxythiophene) or PANI (polyaniline) derivatives as the hole injection and puffer layer, aromatic diamines like Spiro-TAD (2,2',7,7'- tetrakis(diphenylamino)spiro-9,9'-bifluorene) as a hole transport material (HTM), Spiro-DPVBi (2,2',7,7'- tetrakis(2,2-diphenylvinyl)spiro-9,9'-bifluorene) as an emitting material (EM) and of Alq3 (tris(8-hydroxy- quinoline)aluminum) as the electron-injection and electron- transport layer (ETL) were fabricated. White OLEDs were prepared, containing an additional DCM (dicyanmethylene-2- methyl-6-(p-dimethylaminostyryl)-4H-pyran) doped Alq3 layer between the Spiro-DPVBi and Alq3 layer. Use of Spiro-TAD as a hole transport material (HTM) and of Spiro- DPVBi as an emitting material (EM) resulted in dramatically improved temperature stability: for the white and blue OLED no significant deterioration up to 130 degrees Celsius were found. Devices consisting of non spiro components like NPB and/or DPVBi already started to degrade at much lower temperatures.

Paper Details

Date Published: 2 February 2001
PDF: 9 pages
Proc. SPIE 4105, Organic Light-Emitting Materials and Devices IV, (2 February 2001); doi: 10.1117/12.416885
Show Author Affiliations
Hubert Spreitzer, Covion Organic Semiconductors GmbH (Germany)
Horst Vestweber, Covion Organic Semiconductors GmbH (Germany)
Philipp Stoessel, Covion Organic Semiconductors GmbH (Germany)
Heinrich Becker, Covion Organic Semiconductors GmbH (Germany)

Published in SPIE Proceedings Vol. 4105:
Organic Light-Emitting Materials and Devices IV
Zakya H. Kafafi, Editor(s)

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