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Proceedings Paper

Near-line inspector of optical disk parameters
Author(s): Desheng Meng; Lijun Ma; Longfa Pan; Lei Zhang
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Paper Abstract

In this paper, a new kind of automatic method to test the Parameters of CD/DVD Optical Discs is introduced and named near-line inspector. Being connected to product lines, sampling and testing the discs automatically in batches, our inspector can provide a brief yet revealing profile of optical disc parameters such as electrical variables (HF, Jitter, etc.), physical variables and digital error variables in an acceptable short time so as to reflect the up-to-date condition of the product lines. As a real-time and relatively high-efficiency measurement method, it will be integrated into a perfect test system together with on-line and off-line inspectors. Such a system would be especially suitable for the replication of high-quality optical discs in large volume. The layout of the whole set of test system is described. The feasibility and reliability of near-line method are analyzed based on study by means of a high-precision DVD off-line test system developed by us.

Paper Details

Date Published: 7 February 2001
PDF: 4 pages
Proc. SPIE 4085, Fifth International Symposium on Optical Storage (ISOS 2000), (7 February 2001); doi: 10.1117/12.416871
Show Author Affiliations
Desheng Meng, Tsinghua Univ. (China)
Lijun Ma, Tsinghua Univ. (China)
Longfa Pan, Tsinghua Univ. (China)
Lei Zhang, Tsinghua Univ. (China)

Published in SPIE Proceedings Vol. 4085:
Fifth International Symposium on Optical Storage (ISOS 2000)
Fuxi Gan; Lisong Hou, Editor(s)

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