
Proceedings Paper
Improvements of optical, mechanical, and geometrical properties of DVD-RAM substrateFormat | Member Price | Non-Member Price |
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Paper Abstract
It is necessary to improve optical, geometrical, and mechanical properties in the optical disk substrates as the information storage devices with high storage density using short wavelength lasers are being developed. However, the conventional injection molding process is no longer appropriate for producing the high-density information storage optical disk substrates with superb optical, geometrical, and mechanical properties. It is, therefore, inevitable to develop new concepts for the molding processes. In the present study, DVD-RAM substrates were fabricated by injection-compression molding, which is regarded as the most suitable process to manufacture optical disk substrates. The effects of various processing conditions on the birefringence distribution, the land-groove structure including the groove depth and the surface roughness of the land, and the radial tilt were examined experimentally. It was found that the birefringence, which is regarded as one of the most important optical properties for optical disk, was very sensitive to the mold wall temperature history. Also, the integrity of the replication, represented by the land-groove structure, and the radial tilt were influenced mostly by the mold temperature and the compression pressure.
Paper Details
Date Published: 7 February 2001
PDF: 5 pages
Proc. SPIE 4085, Fifth International Symposium on Optical Storage (ISOS 2000), (7 February 2001); doi: 10.1117/12.416865
Published in SPIE Proceedings Vol. 4085:
Fifth International Symposium on Optical Storage (ISOS 2000)
Fuxi Gan; Lisong Hou, Editor(s)
PDF: 5 pages
Proc. SPIE 4085, Fifth International Symposium on Optical Storage (ISOS 2000), (7 February 2001); doi: 10.1117/12.416865
Show Author Affiliations
Su-dong Moon, Yonsei Univ. (South Korea)
Kibyung Seong, Yonsei Univ. (South Korea)
Hyun Kim, Yonsei Univ. (South Korea)
Kibyung Seong, Yonsei Univ. (South Korea)
Hyun Kim, Yonsei Univ. (South Korea)
Shinill Kang, Yonsei Univ. (South Korea)
Jun-Seok Lee, LG Corporate Institute of Technology (South Korea)
Dong Cheol Lee, LG Corporate Institute of Technology (South Korea)
Jun-Seok Lee, LG Corporate Institute of Technology (South Korea)
Dong Cheol Lee, LG Corporate Institute of Technology (South Korea)
Published in SPIE Proceedings Vol. 4085:
Fifth International Symposium on Optical Storage (ISOS 2000)
Fuxi Gan; Lisong Hou, Editor(s)
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