
Proceedings Paper
Thermal stability in magneto-optical recording media: analysis of magnetization decayFormat | Member Price | Non-Member Price |
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Paper Abstract
Thermal stability of amorphous TbFeCo monolayers and {TbFeCo/Pt} multilayers is studied by magnetic viscosity measurements M(t). Using, isothermal remanence measurements the relationship between the magnetization reversal process and its time dependence has been investigated. The non-linear evolution of magnetization with ln(time) happens when the mechanism responsible for magnetization reversal process is mainly domain nucleation. On the other hand domain wall motion process induces a linear M(t) behavior. For multilayers with very small Pt thickness (samples with high square hysteresis loop), magnetization time decay can be described easily by a single energy barrier EB model. As Pt thickness increases, distribution of EB becomes wider leading to almost linear magnetization decay with ln(time) as in longitudinal recording media. The activation volume is determined for these media and shows a strong correlation with reversing field, thus yielding variations of stability over a written bit.
Paper Details
Date Published: 7 February 2001
PDF: 4 pages
Proc. SPIE 4085, Fifth International Symposium on Optical Storage (ISOS 2000), (7 February 2001); doi: 10.1117/12.416811
Published in SPIE Proceedings Vol. 4085:
Fifth International Symposium on Optical Storage (ISOS 2000)
Fuxi Gan; Lisong Hou, Editor(s)
PDF: 4 pages
Proc. SPIE 4085, Fifth International Symposium on Optical Storage (ISOS 2000), (7 February 2001); doi: 10.1117/12.416811
Show Author Affiliations
Rachid Sbiaa, Toyota Technological Institute (Japan)
Mitsunori Mochida, Toyota Technological Institute (Japan)
Mitsunori Mochida, Toyota Technological Institute (Japan)
Yusuki Itoh, Toyota Technological Institute (Japan)
Takao Suzuki, Toyota Technological Institute (Japan)
Takao Suzuki, Toyota Technological Institute (Japan)
Published in SPIE Proceedings Vol. 4085:
Fifth International Symposium on Optical Storage (ISOS 2000)
Fuxi Gan; Lisong Hou, Editor(s)
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