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Proceedings Paper

Radiation properties of the Linac Coherent Light Source: challenges for x-ray optics
Author(s): John R. Arthur; Roman O. Tatchyn
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Paper Abstract

The Linac Coherent Light Source (LCLS) is a free-electron (FEL) now in the advanced planning stage at the Stanford Linear Accelerator Center. This machine will employ the process of self-amplified spontaneous emission (SASE) to generate extremely bright pulses of hard x-ray radiation, at wavelengths d own to about 1.5A. Being the first laser to operate in this spectral region, it will produce radiation with properties that are radically different in several respects from that produced by any other x-ray source, including today's 3rd generation synchrotron sources. Using this radiation to best scientific advantage will place unprecedented demands on the x-ray optics. Most importantly, the LCLS will be a pulsed radiation source, with extremely intense, short pulses and a low duty cycle. It will be possible and desirable to collect a complete experimental data set with a single radiation pulse. This will require optics which manipulate a single pulse so as to cover the full range of parameter space to be studied. Also, because of the very high peak power, sub-picosecond pulse length, and very high coherence of the FEL pulse, optics must be robust and able to preserve the short pulse length, and able to preserve spatial coherence. Finally, since it seems likely that the LCLS FEL radiation will be right enough to promote nonlinear x-ray processes, there will be a need for optics which emphasize particular nonlinear effects.

Paper Details

Date Published: 25 January 2001
PDF: 8 pages
Proc. SPIE 4143, X-Ray FEL Optics and Instrumentation, (25 January 2001); doi: 10.1117/12.413677
Show Author Affiliations
John R. Arthur, Stanford Synchrotron Radiation Lab. (United States)
Roman O. Tatchyn, Stanford Synchrotron Radiation Lab. (United States)

Published in SPIE Proceedings Vol. 4143:
X-Ray FEL Optics and Instrumentation
Dennis M. Mills; Horst Schulte-Schrepping; John R. Arthur, Editor(s)

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