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Proceedings Paper

Study of clamping-induced deformations on SR optics by means of LTP
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Paper Abstract

With the advent of third generation synchrotron radiation sources, more flux was available for the experimentalist. At the same time, the request in term of spot dimension and energy resolution rapidly increased. For this reason, opticians try to design beamlines with higher and higher performances. To this end the shape of every optical component of a beamline is specified to have very tight constrains, because every small figure error produces a sudden reduction in terms of the overall performance. Nevertheless, the necessity to positioning and cooling the components implies the presence of a safe clamping system which unavoidably would modifies the shape of the component, causing possible reduction of resolving power or increasing the spot dimension. Thus it is not sufficient to measure accurately the slope or the profile of a mirror in laboratory before the mounting, but it is useful to test it also after this procedure. We, at ELETTRA, have measured by means of a modified version of the LTP II (Long Trace Profiler) several mirrors and gratings before and after their clamping, in order to estimate the effect of the holder on the final performances of the beamlines. Since our LTP II measures directly the local slope of the surface under test with a repeatability better than 0.02 arcsec on a 1 meter long optical surface, it is very easy to single out any small distortion of the tangential profile introduced by the mounting system. Different kinds of supports for both small and large optical elements, were taken into consideration and the effect of the deformation induced by them on the beamline performance was simulated and will be presented here together with the results of each measurements. The results give us a way to select properly the kind of clamping and invite the opticians to try to take into consideration also this effect before designing a complex beamline.

Paper Details

Date Published: 5 January 2001
PDF: 8 pages
Proc. SPIE 4145, Advances in X-Ray Optics, (5 January 2001); doi: 10.1117/12.411656
Show Author Affiliations
Daniele Cocco, Sincrotrone Trieste (Italy)
Giovanni Sostero, Sincrotrone Trieste (Italy)
Marco Zangrando, Lab. TASC/Istituto Nazionale per la Fisica della Materia (Italy)

Published in SPIE Proceedings Vol. 4145:
Advances in X-Ray Optics
Alan G. Michette; Andreas K. Freund; Tetsuya Ishikawa; Sebastian Oestreich; Derrick C. Mancini; Ali M. Khounsary; Derrick C. Mancini; Alan G. Michette; Sebastian Oestreich, Editor(s)

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