Share Email Print

Proceedings Paper

X-ray deflector: theory, design, and applications
Format Member Price Non-Member Price
PDF $17.00 $21.00

Paper Abstract

Multilayer depth-graded structures make possible creating the x-ray mirrors with the reflection angular width of about 0.2 degrees - 0.5 degrees at the wavelength of 1.54 angstrom. Special numerical optimization techniques, such as needle variations, Powell method, and some other were used to calculate the multilayer structures with desired reflection curves. It was found that for CuK radiation and the angular interval 0.5 - 0.9 degrees W-C an W-B4C structures can have the mean reflectivity about 30% with the relative deviation from uniformity better than 0.7%. Such multilayer mirrors were successfully manufactured on quartz substrates with roughness level of about 6 angstrom using magnetron sputtering technology. On this basis the first computer-driven x-ray deflector was designed and tested. For the mirror angular interval of 0.4 degree the output beam deflection interval is equal to 0.8 degree, that is enough for a variety of applications. The laboratory experiments with the deflector included the x-ray raster imaging with the resolution of about 20 micrometers, and automatic beam adjustment and re-aiming. Another possible applications are the x-ray microscopy, compensation for orbital motion of space x-ray telescopes, space x-ray communication.

Paper Details

Date Published: 5 January 2001
PDF: 8 pages
Proc. SPIE 4145, Advances in X-Ray Optics, (5 January 2001); doi: 10.1117/12.411646
Show Author Affiliations
Vladimir V. Protopopov, Institute of Physics and Technology (Russia)

Published in SPIE Proceedings Vol. 4145:
Advances in X-Ray Optics
Alan G. Michette; Andreas K. Freund; Tetsuya Ishikawa; Sebastian Oestreich; Derrick C. Mancini; Ali M. Khounsary; Derrick C. Mancini; Alan G. Michette; Sebastian Oestreich, Editor(s)

© SPIE. Terms of Use
Back to Top
Sign in to read the full article
Create a free SPIE account to get access to
premium articles and original research
Forgot your username?