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Proceedings Paper

Phase-sensitive data collection in x-ray crystallography using reference-beam diffraction
Author(s): Qun Shen; Stefan Kycia; Ivan Dobrianov; Daniel Pringle
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Paper Abstract

We present recent theoretical and instrumentation developments in phase-sensitive x-ray crystallography using a reference- beam data collection technique. The technique is based on the principle of three-beam or multiple-beam interference, but unlike the conventional method where interference profiles are measured one at a time, the reference-beam diffraction technique integrates three-beam diffraction into the popular oscillation method of data collection, and allows parallel recording of many three-beam interference profiles on an area detector simultaneously. Complete interference profiles are measured by taking multiple oscillation exposures while stepping through the rocking curve of the reference reflection. Recent developments include a portable five-circle kappa diffractometer designed to be a part of an automated reference-beam oscillation setup, and a simplified three-beam diffraction theory using a distorted-wave approach that can be used in reference-beam data analyses to extract the reflection phases.

Paper Details

Date Published: 5 January 2001
PDF: 7 pages
Proc. SPIE 4145, Advances in X-Ray Optics, (5 January 2001); doi: 10.1117/12.411632
Show Author Affiliations
Qun Shen, Cornell Univ. (United States)
Stefan Kycia, Cornell Univ. (United States)
Ivan Dobrianov, Cornell Univ. (United States)
Daniel Pringle, Cornell Univ. (United States)

Published in SPIE Proceedings Vol. 4145:
Advances in X-Ray Optics
Alan G. Michette; Andreas K. Freund; Tetsuya Ishikawa; Sebastian Oestreich; Derrick C. Mancini; Ali M. Khounsary; Derrick C. Mancini; Alan G. Michette; Sebastian Oestreich, Editor(s)

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