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Proceedings Paper

JEM/SMILES limb-sounding of stratospheric trace species II: simulation results for JEM/SMILES observations
Author(s): Yasuko Kasai; Chikako Takahashi; Sho Tsujimaru; Satoshi Ochiai; Stefan Buehler; Kenshi Takahashi; Tomoko Shirai; Hiroyuki Ozeki; Masato Shiotani
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Paper Abstract

JEM/SMILES (superconducting SubMIllimeter-wave Limb-Emission Sounder) is currently under development to demonstrate a submillimeter-wave sounder with extremely high sensitivity on the platform of the Japanese Experiment Module (JEM). In the submillimeter region, this is the first mission in space using a low-noise 4K cooled receiver, which is expected to give new observations for radicals in the stratosphere such as BrO. One of the most unique characteristics of the JEM/SMILES observation is its high sensitivity in detecting atmospheric limb emissions in the submillimeter wave range. The purpose of SMILES is global monitoring of the radicals which play important roles in the stratospheric system. We are now using the newly developed JEM/SMILES simulator to model observed spectra (including the characteristics of the SMILES sensor) and simulate the retrieval performance. Some preliminary results of the simulation are obtained in view of the scientific targets of JEM/SMILES.

Paper Details

Date Published: 21 December 2000
PDF: 11 pages
Proc. SPIE 4152, Microwave Remote Sensing of the Atmosphere and Environment II, (21 December 2000); doi: 10.1117/12.410606
Show Author Affiliations
Yasuko Kasai, Communications Research Lab. (Japan)
Chikako Takahashi, Fujitsu FIP Corp. (Japan)
Sho Tsujimaru, National Space Development Agency of Japan (Japan)
Satoshi Ochiai, Communications Research Lab. (Japan)
Stefan Buehler, Univ. of Bremen (Germany)
Kenshi Takahashi, Nagoya Univ. (Japan)
Tomoko Shirai, Fujitsu FIP Corp. (Japan)
Hiroyuki Ozeki, National Space Development Agency of Japan (Japan)
Masato Shiotani, Hokkaido Univ. (Japan)

Published in SPIE Proceedings Vol. 4152:
Microwave Remote Sensing of the Atmosphere and Environment II
Thomas T. Wilheit; Harunobu Masuko; Hiroyuki Wakabayashi, Editor(s)

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