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Proceedings Paper

Lessons learned in the postprocessing of field spectroradiometric data covering the 0.4-2.5-um wavelength region
Author(s): Terrence H. Hemmer; Todd L. Westphal
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Paper Abstract

As the number of recognized applications for and acceptance of spectral imaging increases, the need for field spectral measurements also increases. The goal of this paper is to help ensure the quality and accuracy of field spectral measurements. Unlike laboratory measurements, where everything is controlled to meticulous detail, field measurements tend to suffer from an almost complete lack of control. Hence, assuring data quality of field measurements can be difficult. To help compensate for some of the problems that arise due to this lack of control, collection protocols are established. Even using collection protocols, sensor artifacts are not always apparent. In this paper, some of these sensor artifacts are presented and discussed. While this paper concentrates on a specific spectrometer, many of the issues, protocols and processing procedures should be generally applicable to most field spectrometers operating in this spectral region.

Paper Details

Date Published: 23 August 2000
PDF: 12 pages
Proc. SPIE 4049, Algorithms for Multispectral, Hyperspectral, and Ultraspectral Imagery VI, (23 August 2000); doi: 10.1117/12.410347
Show Author Affiliations
Terrence H. Hemmer, Spectral Information Technology Applications Ctr. (United States)
Todd L. Westphal, Spectral Information Technology Applications Ctr. (United States)

Published in SPIE Proceedings Vol. 4049:
Algorithms for Multispectral, Hyperspectral, and Ultraspectral Imagery VI
Sylvia S. Shen; Michael R. Descour, Editor(s)

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