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Proceedings Paper

AFM study on silver/HOPG interface sputtered by low-energy argon ions
Author(s): De-Quan Yang; Yuqing Xiong; Weigang Lu; Yun Guo; Dao-an Da
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Paper Abstract

The effect of argon ion bombardment on interface of silver and high oriented pyrogenic graphite (HOPG) was investigated by atomic force microscopy. The Ag/HOPG interface morphology has been explored as a function of irradiation time. It can be seen that the size of crystal particle on HOPG is almost unchanged with increase of irradiation time, while the size of Ag crystal particle in part of the terrace increased and became highly ordered. There is no obvious mixing between Ag and HOPG, and Ag particles in nanoscale are isolated on HOPG surface. This will result in the reduction of depth resolution of the surface analysis by ion sputtering technique.

Paper Details

Date Published: 29 November 2000
PDF: 4 pages
Proc. SPIE 4086, Fourth International Conference on Thin Film Physics and Applications, (29 November 2000); doi: 10.1117/12.408475
Show Author Affiliations
De-Quan Yang, Lanzhou Institute of Physics (China)
Yuqing Xiong, Lanzhou Institute of Physics (China)
Weigang Lu, Lanzhou Univ. (China)
Yun Guo, Lanzhou Institute of Physics (China)
Dao-an Da, Lanzhou Institute of Physics (China)

Published in SPIE Proceedings Vol. 4086:
Fourth International Conference on Thin Film Physics and Applications
Junhao Chu; Pulin Liu; Yong Chang, Editor(s)

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