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Proceedings Paper

Thermal treatments of CdTe and CdZnTe detectors
Author(s): Kaushik Chattopadhyay; X. Ma; Jean-Olivier Ndap; Arnold Burger; Tuviah E. Schlesinger; Corin Michael R. Greaves; Howard L. Glass; J. P. Flint; Ralph B. James
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Paper Abstract

An irreversible deterioration of CdTe and CdZnTe detectors after heat treatments in the temperature range of 150 - 200 degrees Celsius was reported by several authors; however, the nature of the processes responsible for the detector degradation and increased dark currents is not fully understood. In this study we have prepared CdTe and CdZnTe detectors equipped with Au contacts. The detectors were tested before and after thermal annealing under vacuum. Using combined measurements of current voltage characteristics, low temperature photoluminescence and nuclear spectroscopic measurements, we have attempted to differentiate between the various possible contributions to the detector degradation and elucidate the defect formation process involved.

Paper Details

Date Published: 21 November 2000
PDF: 6 pages
Proc. SPIE 4141, Hard X-Ray, Gamma-Ray, and Neutron Detector Physics II, (21 November 2000); doi: 10.1117/12.407595
Show Author Affiliations
Kaushik Chattopadhyay, Fisk Univ. (United States)
X. Ma, Fisk Univ. (United States)
Jean-Olivier Ndap, Fisk Univ. (United States)
Arnold Burger, Fisk Univ. (United States)
Tuviah E. Schlesinger, Carnegie Mellon Univ. (United States)
Corin Michael R. Greaves, Carnegie Mellon Univ. (United States)
Howard L. Glass, Honeywell Electronic Materials (United States)
J. P. Flint, Honeywell Electronic Materials (United States)
Ralph B. James, Sandia National Labs. (United States)

Published in SPIE Proceedings Vol. 4141:
Hard X-Ray, Gamma-Ray, and Neutron Detector Physics II
Ralph B. James; Richard C. Schirato, Editor(s)

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