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Proceedings Paper

Characterization of CZT detectors grown from horizontal and vertical Bridgman
Author(s): Haim Hermon; Michael M. Schieber; Mark S. Goorsky; Terrance Thiem Lam; Evgenie Meerson; H. Walter Yao; Jay Chris Erickson; Ralph B. James
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Paper Abstract

Various types of Cd1-xZnxTe (0.04 < X < 0.24) detector crystals grown by vertical high pressure Bridgman (VHPB), low pressure Bridgman (LPB) i.e. vertical ambient pressure Bridgman (VB), horizontal ambient pressure Bridgman (HB) and vapor grown crystals have been evaluated and compared. We have used the following methods in order to evaluate the CZT: (1) Triaxial crystal x-ray diffraction (TAD) for determination of the surface crystalline homogeneity, (2) Nuclear spectroscopic response of detectors and (3) Sensitivity to radiation from high flux x-rays for investigations of the suitability for x-ray digital imaging. Finally a comparison between the various methods of CZT crystal growth will be given.

Paper Details

Date Published: 21 November 2000
PDF: 8 pages
Proc. SPIE 4141, Hard X-Ray, Gamma-Ray, and Neutron Detector Physics II, (21 November 2000); doi: 10.1117/12.407580
Show Author Affiliations
Haim Hermon, Hebrew Univ. of Jerusalem and Real Time Radiography Readout (Israel)
Michael M. Schieber, Hebrew Univ. of Jerusalem and Sandia National Labs. (Israel)
Mark S. Goorsky, Univ. of California/Los Angeles (United States)
Terrance Thiem Lam, Univ. of California/Los Angeles (United States)
Evgenie Meerson, Real Time Radiography Readout (Israel)
H. Walter Yao, Univ. of Nebraska/Lincoln and Sandia National Labs. (United States)
Jay Chris Erickson, Sandia National Labs. and Univ. of Nebraska/Lincoln (United States)
Ralph B. James, Sandia National Labs. (United States)

Published in SPIE Proceedings Vol. 4141:
Hard X-Ray, Gamma-Ray, and Neutron Detector Physics II
Ralph B. James; Richard C. Schirato, Editor(s)

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