An experimental-analytical technique for x-ray phase retrieval and consequent crystal structure-factor determination is tested and discussed in the cases of high- (rotating anode or synchrotron radiation) or low-flux (fixed anode x-ray tubes) radiation sources. Experimentally measurable reflectivity magnitudes, using a rotating anode or conventional x-ray tube source, affect the directly reconstructed profile of the complex crystal structure-factor. Thermal and point defect diffuse scattering contaminates the tails of the Bragg diffracted intensity. A numerical procedure developed for the regularization of the directly reconstructed complex structure-factor allows the elimination of parasitic fringes in the resulting crystal-lattice strain profiles. In addition, replacement of plus/minus infinity limits in a mathematical formalism of the reconstruction procedure by actually measured experimental values of the scattering vector in practice affects the resulting profile of the complex crystal structure factor.

Date Published: 2 November 2000
PDF: 11 pages
Proc. SPIE 4144, Advances in Laboratory-based X-Ray Sources and Optics, (2 November 2000); doi: 10.1117/12.405892

Published in SPIE Proceedings Vol. 4144:
Advances in Laboratory-based X-Ray Sources and Optics
Carolyn A. MacDonald; Ali M. Khounsary, Editor(s)