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Proceedings Paper

Phase-retrieval x-ray diffractometry in the case of high- or low-flux radiation source
Author(s): Andrei Yurievich Nikulin; Peter Zaumseil
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Paper Abstract

An experimental-analytical technique for x-ray phase retrieval and consequent crystal structure-factor determination is tested and discussed in the cases of high- (rotating anode or synchrotron radiation) or low-flux (fixed anode x-ray tubes) radiation sources. Experimentally measurable reflectivity magnitudes, using a rotating anode or conventional x-ray tube source, affect the directly reconstructed profile of the complex crystal structure-factor. Thermal and point defect diffuse scattering contaminates the tails of the Bragg diffracted intensity. A numerical procedure developed for the regularization of the directly reconstructed complex structure-factor allows the elimination of parasitic fringes in the resulting crystal-lattice strain profiles. In addition, replacement of plus/minus infinity limits in a mathematical formalism of the reconstruction procedure by actually measured experimental values of the scattering vector in practice affects the resulting profile of the complex crystal structure factor.

Paper Details

Date Published: 2 November 2000
PDF: 11 pages
Proc. SPIE 4144, Advances in Laboratory-based X-Ray Sources and Optics, (2 November 2000); doi: 10.1117/12.405892
Show Author Affiliations
Andrei Yurievich Nikulin, Monash Univ. (Australia)
Peter Zaumseil, Innovations for High-Performance Microelectronics (Germany)

Published in SPIE Proceedings Vol. 4144:
Advances in Laboratory-based X-Ray Sources and Optics
Carolyn A. MacDonald; Ali M. Khounsary, Editor(s)

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