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Proceedings Paper

Production of a high-resolution spot for ellipsometric scanning immunology using an off-the-shelf light-emitting diode
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Paper Abstract

A modified ellipsometric optical system has been designed for an in-vitro medical diagnostic instrument using an off- the-shelf 525-nm LED source. System requirements included a 20 degree (+/- 1 deg) incident angle, 1 uW (min) assay surface incident power, 300 um (max) incident spot diameter (full spatial extent) and 500:1 (min) detector S/N in normal room light. The fixed polarization ellipsometric optical analysis method is discussed, and the lens prescription used in a prototype instrument is given. Zemas spot size analyses are given, as well as a theoretical model for S/N assessment. Incident spot size and optical power data are provided which agree with the theory presented. Finally, the application of results and typical scanned signal output are discussed.

Paper Details

Date Published: 24 October 2000
PDF: 12 pages
Proc. SPIE 4093, Current Developments in Lens Design and Optical Systems Engineering, (24 October 2000); doi: 10.1117/12.405218
Show Author Affiliations
Stephen M. Tobin, Arthur D. Little, Inc. (United States)
Shao Yang, Biostar, Inc. (United States)

Published in SPIE Proceedings Vol. 4093:
Current Developments in Lens Design and Optical Systems Engineering
Robert E. Fischer; Robert E. Fischer; R. Barry Johnson; Warren J. Smith; Warren J. Smith; William H. Swantner, Editor(s)

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