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Proceedings Paper

Processing application used in beam characterization
Author(s): Wei Sun; Chunqing Gao; Guang Hui Wei
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Paper Abstract

CCD based laser beam characterization system is widely used in many experimental and industrial applications. Besides many factors of the CCD measurement system and the properties of the beams power density distributions to be measured, the obtained accuracy of laser beam characterization also strongly depends on the effectiveness of data processing algorithm. In this paper a Windows based processing application and its features and key processing algorithm are introduced and also a software related proposal is raised, such as common interface of measurement on simulated beam with given beam width, background and noise; universal image data storage format which would facilitate the international wide collaboration on the effectiveness evaluation of different processing application and system.

Paper Details

Date Published: 10 October 2000
PDF: 6 pages
Proc. SPIE 4222, Process Control and Inspection for Industry, (10 October 2000); doi: 10.1117/12.403897
Show Author Affiliations
Wei Sun, Beijing Institute of Technology (China)
Chunqing Gao, Beijing Institute of Technology (China)
Guang Hui Wei, Beijing Institute of Technology (China)

Published in SPIE Proceedings Vol. 4222:
Process Control and Inspection for Industry
Shulian Zhang; Wei Gao, Editor(s)

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