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Proceedings Paper

Further evaluation of the Exicor birefringence measurement system
Author(s): Baoliang Bob Wang
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Paper Abstract

We recently developed a linear birefringence measurement instrument, known as the Exicor system, using photoelastic modulator (PEM) technology. We have reported the precision and short-term stability of this instrument. In this paper, the author further evaluates the accuracy, long-term stability, and instrumental performance under low light intensity levels of the Exicor system.

Paper Details

Date Published: 11 October 2000
PDF: 7 pages
Proc. SPIE 4103, Optical Diagnostic Methods for Inorganic Materials II, (11 October 2000); doi: 10.1117/12.403586
Show Author Affiliations
Baoliang Bob Wang, Hinds Instruments, Inc. (United States)

Published in SPIE Proceedings Vol. 4103:
Optical Diagnostic Methods for Inorganic Materials II
Leonard M. Hanssen, Editor(s)

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