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Proceedings Paper

Reflectometer for pseudo-Brewster angle spectrometry (BAIRS)
Author(s): Roy F. Potter
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Paper Abstract

A simple, robust reflectometer, pre-set for several angles of incidence (AOI), has been designed and used for determining the optical parameters of opaque samples having a specular surface. A single, linear polarizing element permits the measurement of perpendicular(s) and parallel (p) reflectence at each AOI. The BAIRS algorithm determines the empirical optical parameters for the subject surface at the pseudo-Brewster AOI, based on the measurement of p/s at two AOI's and, in turn the optical constants n and k (or (epsilon) 1 and (epsilon) 2). Radiation sources in current use, are a stabilized tungsten-halide lamp or a deuterium lamp for the visible and near UV spectral regions. Silica fiber optics and lenses deliver input and output radiation from the source and to a CCD array scanned diffraction spectrometer. Results for a sample of GaAs will be presented along with a discussion of dispersion features in the optical constant spectra.

Paper Details

Date Published: 11 October 2000
PDF: 5 pages
Proc. SPIE 4103, Optical Diagnostic Methods for Inorganic Materials II, (11 October 2000);
Show Author Affiliations
Roy F. Potter, Western Washington Univ. (United States)

Published in SPIE Proceedings Vol. 4103:
Optical Diagnostic Methods for Inorganic Materials II
Leonard M. Hanssen, Editor(s)

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