Proceedings Paper
New inverse computation for optical-absorption coefficient in semiconductor material| Format | Member Price | Non-Member Price |
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Paper Abstract
In this paper, for an inhomogeneous material in which the thermal conductivity is varied as a function of depth, we propose an efficient method to inversely compute the depth distribution of optical-absorption coefficient by the surface temperature of the material. The results of inverse computation by a group of surface temperature data show that some more accurate optical- absorption coefficients can be obtained.
Paper Details
Date Published: 9 October 2000
PDF: 5 pages
Proc. SPIE 4221, Optical Measurement and Nondestructive Testing: Techniques and Applications, (9 October 2000); doi: 10.1117/12.402636
Published in SPIE Proceedings Vol. 4221:
Optical Measurement and Nondestructive Testing: Techniques and Applications
FeiJun Song; Frank Chen; Michael Y.Y. Hung; H.M. Shang, Editor(s)
PDF: 5 pages
Proc. SPIE 4221, Optical Measurement and Nondestructive Testing: Techniques and Applications, (9 October 2000); doi: 10.1117/12.402636
Show Author Affiliations
Jianxin Zhu, Zhejiang Univ. (China)
Published in SPIE Proceedings Vol. 4221:
Optical Measurement and Nondestructive Testing: Techniques and Applications
FeiJun Song; Frank Chen; Michael Y.Y. Hung; H.M. Shang, Editor(s)
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