Share Email Print

Proceedings Paper

Nondestructive testing method of crystal surface defectiveness
Author(s): Ekaterina V. Zhukova
Format Member Price Non-Member Price
PDF $17.00 $21.00

Paper Abstract

Article is devoted to a not destroying method of analysis of crystals surface quality for a vacuum ultra-violet range. The registration of absorption spectra of color centers located in a thin near-surface layer of a crystal with the help of a method of attenuated total reflection spectroscopy allows to visualize defective structure layer formed after machining.

Paper Details

Date Published: 9 October 2000
PDF: 6 pages
Proc. SPIE 4221, Optical Measurement and Nondestructive Testing: Techniques and Applications, (9 October 2000); doi: 10.1117/12.402588
Show Author Affiliations
Ekaterina V. Zhukova, Institute of Fine Mechanics and Optics (Russia)

Published in SPIE Proceedings Vol. 4221:
Optical Measurement and Nondestructive Testing: Techniques and Applications
FeiJun Song; Frank Chen; Michael Y.Y. Hung; H.M. Shang, Editor(s)

© SPIE. Terms of Use
Back to Top
Sign in to read the full article
Create a free SPIE account to get access to
premium articles and original research
Forgot your username?