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Proceedings Paper

Key factors in accurate beam characterization application
Author(s): Wei Sun; Chunqing Gao; Guang Hui Wei
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Paper Abstract

The accuracy of CCD based laser beam characterization has been widely discussed for years in the industry. As we know the obtained accuracy of laser beam characterization depends strongly on many factors of the CCD measurement system and on the properties of the laser beam's power density distribution to be measured. In this paper we discussed the influence of these factors through simulated calculation and investigation. A mathematically generated Gaussian and Super Gaussian beam was computer generated, background and random noise with a Gaussian distribution were added to the mathematically generated beam. Measurements were then made based on second moment method with is a ISO definition. We change the background, noise level and the size of integration area during the simulated calculation so as to determine the influence on the accuracy of beam width measurement of these different factors. The research result shows that image background subtraction and noise control play a very important role in the accurate measurement system and application. According to the investigation we designed a measurement system and application which has high dynamic range, an appropriate processing and calculation algorithm which can control the background and random noise effectively so that get high beam measurement accuracy.

Paper Details

Date Published: 9 October 2000
PDF: 5 pages
Proc. SPIE 4221, Optical Measurement and Nondestructive Testing: Techniques and Applications, (9 October 2000); doi: 10.1117/12.402568
Show Author Affiliations
Wei Sun, Beijing Institute of Technology (China)
Chunqing Gao, Beijing Institute of Technology (China)
Guang Hui Wei, Beijing Institute of Technology (China)

Published in SPIE Proceedings Vol. 4221:
Optical Measurement and Nondestructive Testing: Techniques and Applications
FeiJun Song; Frank Chen; Michael Y.Y. Hung; H.M. Shang, Editor(s)

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