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Proceedings Paper

Spherulites, positrons, and SAXS in PP films
Author(s): M. Debowska; D. W. Gidley; Czeslaw Slusarczyk; W. Binias; A. Muszer
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Paper Abstract

Three polypropylene films of constant thickness (approximately equals 50(mu) m) and different morphology were studied with use of an polarizing microscope, slow positron annihilation lifetime technique, wide and small angle X- ray scattering and attenuated total reflection of infrared radiation. Correlation was observed between the intensities of the intermediate components in the positron lifetime spectra; (lifetimes (tau) 2 equals 1.3 ns and (tau) 3approximately equals 2.3divided by2.8ns) and crystallinity of samples. The evident trend is for the longer-lived (tau) 3-component intensity to decrease with crystallinity while the reverse is true for the shorter, fixed (tau) 2-component. The decrease in the intensity of the longer-lived component can result from reduction of the fractional free volume. Changes of annihilation parameters with the positron penetration depth were observed that may reflect the spatial heterogeneity of samples resulting form the way of their crystallization and possible oxidation of the subsurface regions.

Paper Details

Date Published: 25 September 2000
PDF: 7 pages
Proc. SPIE 4240, X-Ray Investigations of Polymer Structures II, (25 September 2000); doi: 10.1117/12.401843
Show Author Affiliations
M. Debowska, Univ. of Wroclaw (Poland)
D. W. Gidley, Univ. of Michigan (United States)
Czeslaw Slusarczyk, Technical Univ. of Lodz (Poland)
W. Binias, Technical Univ. of Lodz (Poland)
A. Muszer, Univ. of Wroclaw (Poland)

Published in SPIE Proceedings Vol. 4240:
X-Ray Investigations of Polymer Structures II
Andrzej Wlochowicz, Editor(s)

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