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Proceedings Paper

Wavelet transform and its use in edge detection
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Paper Abstract

The application of the wavelet transform to edge detection is discussed in general. In particular, two new wavelet transforms for edge detection as well as detecting the center of two edges are presented and discussed in detail. The proposed method is useful for lead inspection of surface mount devices in the electronic industry.

Paper Details

Date Published: 3 October 2000
PDF: 11 pages
Proc. SPIE 4220, Advanced Photonic Sensors: Technology and Applications, (3 October 2000); doi: 10.1117/12.401699
Show Author Affiliations
Feijun Song, China Daheng Corp. (China)
Suganda Jutamulia, Blue Sky Research (United States)

Published in SPIE Proceedings Vol. 4220:
Advanced Photonic Sensors: Technology and Applications
Jinfa Tang; Chao-Nan Xu; Haizhang Li, Editor(s)

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