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Proceedings Paper

Diagnostics and growth of organic thin films for electro-optic modulators with low-driving voltage
Author(s): Zhifu Liu; Sergey S. Sarkisov; Michael J. Curley; Alexander Leyderman; Yulong Cui; Javier Wu Li; Benjamin G. Penn
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Paper Abstract

The focus of this paper is the characterization of electro- optic properties of single crystal thin films of organic material NPP grown by the plate-guided method. Characterization was performed using the longitudinal a.c. modulation technique. Half-wave voltage V(pi ), figure-of- merit F, and electro-optic coefficient r63 were estimated to be 3.24 kV, 0.98 X 10-10 m/V and 25.8 MUL 10-12 m/V respectively. We found that crystalline z-axis is off the normal to the plane of the film at an angle of 70. We also proposed a transverse version of a thin film electro-optic modulator with low driving voltage, which is based on a single-arm thin film waveguide interferometer.

Paper Details

Date Published: 29 September 2000
PDF: 12 pages
Proc. SPIE 4098, Optical Devices and Diagnostics in Materials Science, (29 September 2000); doi: 10.1117/12.401644
Show Author Affiliations
Zhifu Liu, Alabama A&M Univ. (United States)
Sergey S. Sarkisov, Alabama A&M Univ. (United States)
Michael J. Curley, Alabama A&M Univ. (United States)
Alexander Leyderman, Univ. of Puerto Rico/Mayaguez (United States)
Yulong Cui, Univ. of Puerto Rico/Mayaguez (United States)
Javier Wu Li, Univ. of Puerto Rico/Mayaguez (United States)
Benjamin G. Penn, NASA Marshall Space Flight Ctr. (United States)

Published in SPIE Proceedings Vol. 4098:
Optical Devices and Diagnostics in Materials Science
David L. Andrews; David L. Andrews; Toshimitsu Asakura; Suganda Jutamulia; Wiley P. Kirk; Max G. Lagally; Ravindra B. Lal; James D. Trolinger, Editor(s)

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