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Proceedings Paper

Modeling mark edge jitter in phase-change recording
Author(s): Aparna C. Sheila; David N. Lambeth; Tuviah E. Schlesinger
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Paper Abstract

In this paper, we develop a model for the statistical nature of nucleation in phase change recording media and use it to estimate the mark edge jitter arising from the nucleation process. We then investigate the dependence of mark edge jitter on the erase power and reflection layer thickness.

Paper Details

Date Published: 18 September 2000
PDF: 6 pages
Proc. SPIE 4090, Optical Data Storage 2000, (18 September 2000); doi: 10.1117/12.399338
Show Author Affiliations
Aparna C. Sheila, Carnegie Mellon Univ. (United States)
David N. Lambeth, Carnegie Mellon Univ. (United States)
Tuviah E. Schlesinger, Carnegie Mellon Univ. (United States)

Published in SPIE Proceedings Vol. 4090:
Optical Data Storage 2000
Douglas G. Stinson; Ryuichi Katayama, Editor(s)

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