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Proceedings Paper

Noncontact laser metrology with real-time detection and high-speed processing for material analysis
Author(s): Yunlu Zou; Tin M. Aye; Gajendra D. Savant; Andrew A. Kostrzewski; Dai Hyun Kim; Charles G. Pergantis
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Paper Abstract

This paper describes the development of real-time non-contact metrology based on holographic interferometry and neural network fringe analysis software to detect defects in composite materials. The object under inspection is illuminated by a high-power solid-state laser, and the light scattered from the material surface is recorded in real time using a double-exposure holographic interferometer, which can detect minute surface deformation caused by defects in the material. Thermal stimulation of the object creates a non- uniform time-varying material reaction, which causes surface deformation that is characteristic of the material's internal structure. This deformation in turn creates time-varying interference patterns, which are recorded by a real-time holographic interferometric system and displayed on the computer monitor through a CCD camera. The system allows real- time, in-depth non-contact inspection of composite materials used in aircraft and other military vehicles. A genetic algorithm has also been developed for fast data processing in a non-laboratory environment. The sophisticated neural network recognizes the types of defects at high speed.

Paper Details

Date Published: 5 September 2000
PDF: 12 pages
Proc. SPIE 4035, Laser Radar Technology and Applications V, (5 September 2000); doi: 10.1117/12.397799
Show Author Affiliations
Yunlu Zou, Physical Optics Corp. (United States)
Tin M. Aye, Physical Optics Corp. (United States)
Gajendra D. Savant, Physical Optics Corp. (United States)
Andrew A. Kostrzewski, Physical Optics Corp. (United States)
Dai Hyun Kim, Physical Optics Corp. (United States)
Charles G. Pergantis, Army Research Lab. (United States)

Published in SPIE Proceedings Vol. 4035:
Laser Radar Technology and Applications V
Gary W. Kamerman; Upendra N. Singh; Christian Werner; Vasyl V. Molebny, Editor(s)

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