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Proceedings Paper

Design and process issues affecting performance of optical interconnects on ICs
Author(s): Bharat L. Bhuva; Dong Jiang; David V. Kerns Jr.; Sherra E. Kerns
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Paper Abstract

With the exponential increase in device densities and operating speeds, further improvements in chip performance are more difficult to achieve due to the physical limitations of conventional interconnects. Optical interconnects provide one of the solutions to continue improving performance of future technologies. Unlike other optical systems, the prosed approach requires minimal changes in conventional fabrication processes. Other major barriers to industry-wide acceptance are perceived limitations in performance. In this research, models have been developed to show that the performance of optical interconnects is a strong function of technology and layout.

Paper Details

Date Published: 18 August 2000
PDF: 4 pages
Proc. SPIE 4181, Challenges in Process Integration and Device Technology, (18 August 2000); doi: 10.1117/12.395719
Show Author Affiliations
Bharat L. Bhuva, Vanderbilt Univ. (United States)
Dong Jiang, Vanderbilt Univ. (United States)
David V. Kerns Jr., Olin College of Engineering (United States)
Sherra E. Kerns, Olin College of Engineering (United States)

Published in SPIE Proceedings Vol. 4181:
Challenges in Process Integration and Device Technology
David Burnett; Shin'ichiro Kimura; Bhanwar Singh, Editor(s)

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