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Proceedings Paper

Silicon grisms for high-resolution spectroscopy in the near infrared
Author(s): Fabrizio Vitali; Elena Cianci; Dario Lorenzetti; Vittorio Foglietti; Andrea Notargiacomo; Ennio Giovine; Ernesto Oliva
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Paper Abstract

We present the first results of a fabrication process aimed to produce IR grisms with high refractive index. Such devices are intended to implement a high resolution mode in the near IR camera-spectrograph, a user instrument at the focal plane of the Italian national telescope Galileo. Litho masking and anisotropic etching techniques have been employed to get, firstly, silicon gratings of suitable size for astronomical use, then warm bonding techniques will be used to obtain the final grisms in echelle configuration. The results of the laboratory test on the first prototype are presented.

Paper Details

Date Published: 16 August 2000
PDF: 12 pages
Proc. SPIE 4008, Optical and IR Telescope Instrumentation and Detectors, (16 August 2000); doi: 10.1117/12.395457
Show Author Affiliations
Fabrizio Vitali, Osservatorio Astronomico di Roma (Italy)
Elena Cianci, Osservatorio Astronomico di Roma (Italy)
Dario Lorenzetti, Osservatorio Astronomico di Roma (Italy)
Vittorio Foglietti, Istituto di Elettronica dello Stato Solido (Italy)
Andrea Notargiacomo, Istituto di Elettronica dello Stato Solido (Italy)
Ennio Giovine, INFM and Univ. degli Studi di Roma III (Italy)
Ernesto Oliva, Osservatorio Astrofisico di Arcetri (Spain)


Published in SPIE Proceedings Vol. 4008:
Optical and IR Telescope Instrumentation and Detectors
Masanori Iye; Alan F. M. Moorwood, Editor(s)

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