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Proceedings Paper

Performance comparison of rectangular (4-point) and diagonal (2-point) dither
Author(s): Keith A. Krapels; Ronald G. Driggers; Richard H. Vollmerhausen; Carl E. Halford
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Paper Abstract

Staring array imagers can exhibit sampling artifacts. Dither is a mechanical means of raising the spatial sampling rate without increasing the number of detectors on the focal plane array. Diagonal (two-point or slant-path) dither is easier to implement mechanically than rectangular (four- point orbow-tie) dither. Also, diagonal dither generates half the data rate of rectangular dither. However, diagonal dither does not sample the image as effectively as rectangular dither. The cost and complexity advantages of diagonal dither must be traded against the expectation of reduced performance. This paper discusses analytical and empirical predictions of the performance difference between diagonal and rectangular dither.

Paper Details

Date Published: 17 July 2000
PDF: 19 pages
Proc. SPIE 4030, Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XI, (17 July 2000); doi: 10.1117/12.391776
Show Author Affiliations
Keith A. Krapels, U.S. Army Night Vision & Electronic Sensors Directorate (United States)
Ronald G. Driggers, U.S. Army Night Vision & Electronic Sensors Directorate (United States)
Richard H. Vollmerhausen, U.S. Army Night Vision & Electronic Sensors Directorate (United States)
Carl E. Halford, Univ. of Memphis (United States)


Published in SPIE Proceedings Vol. 4030:
Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XI
Gerald C. Holst, Editor(s)

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