
Proceedings Paper
InSb focal plane array (FPAs) grown by molecular beam epitaxy (MBE)Format | Member Price | Non-Member Price |
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Paper Abstract
Staring InSb FPAs grown by MBE have been demonstrated. Low growth temperatures have been employed to provide p+-n- n+ photodiodes with a dark, 80 K ROA equals 9 X 105(Omega) cm2. A degenerately doped substrate has been used to provide transparency in the 3.5 micrometer - 5.5 micrometer spectral region. Free carrier absorption necessitates some thinning of the substrate and an anti- reflection coated external quantum efficiency of 62% has been achieved with a final thickness of approximately equals 40 micrometer. 320 X 256 FPA's operating at 90 K and looking at a 295 K scene in f/2 have a noise equivalent temperature (NE(Delta) T) at half well of 10.4 mK. FPA operability exceeds 99.7%.
Paper Details
Date Published: 17 July 2000
PDF: 6 pages
Proc. SPIE 4028, Infrared Detectors and Focal Plane Arrays VI, (17 July 2000); doi: 10.1117/12.391753
Published in SPIE Proceedings Vol. 4028:
Infrared Detectors and Focal Plane Arrays VI
Eustace L. Dereniak; Robert E. Sampson, Editor(s)
PDF: 6 pages
Proc. SPIE 4028, Infrared Detectors and Focal Plane Arrays VI, (17 July 2000); doi: 10.1117/12.391753
Show Author Affiliations
Tim Ashley, Defence Evaluation and Research Agency Malvern (United Kingdom)
Ian M. Baker, BAE Systems Infra-Red Ltd. (United Kingdom)
Theresa M. Burke, Defence Evaluation and Research Agency Malvern (United Kingdom)
David T. Dutton, Defence Evaluation and Research Agency Malvern (United Kingdom)
John A. Haigh, Defence Evaluation and Research Agency Malvern (United Kingdom)
Ian M. Baker, BAE Systems Infra-Red Ltd. (United Kingdom)
Theresa M. Burke, Defence Evaluation and Research Agency Malvern (United Kingdom)
David T. Dutton, Defence Evaluation and Research Agency Malvern (United Kingdom)
John A. Haigh, Defence Evaluation and Research Agency Malvern (United Kingdom)
Leslie G. Hipwood, BAE Systems Infra-Red Ltd. (United Kingdom)
Richard Jefferies, Defence Evaluation and Research Agency Malvern (United Kingdom)
Alan David Johnson, Defence Evaluation and Research Agency Malvern (United Kingdom)
Peter Knowles, BAE Systems Infra-Red Ltd. (United Kingdom)
J. Chris Little, Defence Evaluation and Research Agency Malvern (United Kingdom)
Richard Jefferies, Defence Evaluation and Research Agency Malvern (United Kingdom)
Alan David Johnson, Defence Evaluation and Research Agency Malvern (United Kingdom)
Peter Knowles, BAE Systems Infra-Red Ltd. (United Kingdom)
J. Chris Little, Defence Evaluation and Research Agency Malvern (United Kingdom)
Published in SPIE Proceedings Vol. 4028:
Infrared Detectors and Focal Plane Arrays VI
Eustace L. Dereniak; Robert E. Sampson, Editor(s)
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