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Proceedings Paper

Innovations in IR projector arrays
Author(s): Barry E. Cole; B. Higashi; Jeff A. Ridley; J. Holmen; K. Newstrom; C. Zins; K. Nguyen; Steven R. Weeres; Burgess R. Johnson; Robert G. Stockbridge; Robert Lee Murrer Jr.; Eric M. Olson; Thomas P. Bergin; James R. Kircher; David S. Flynn
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Paper Abstract

In the past year, Honeywell has developed a 512 X 512 snapshot scene projector containing pixels with very high radiance efficiency. The array can operate in both snapshot and raster mode. The array pixels have near black body characteristics, high radiance outputs, broad band performance, and high speed. IR measurements and performance of these pixels will be described. In addition, a vacuum probe station that makes it possible to select the best die for packaging and delivery based on wafer level radiance screening, has been developed and is in operation. This system, as well as other improvements, will be described. Finally, a review of the status of the present projectors and plans for future arrays is included.

Paper Details

Date Published: 12 July 2000
PDF: 18 pages
Proc. SPIE 4027, Technologies for Synthetic Environments: Hardware-in-the-Loop Testing V, (12 July 2000); doi: 10.1117/12.391704
Show Author Affiliations
Barry E. Cole, Honeywell Inc. (United States)
B. Higashi, Honeywell Inc. (United States)
Jeff A. Ridley, Honeywell Inc. (United States)
J. Holmen, Honeywell Inc. (United States)
K. Newstrom, Honeywell Inc. (United States)
C. Zins, Honeywell Inc. (United States)
K. Nguyen, Honeywell Inc. (United States)
Steven R. Weeres, Honeywell Inc. (United States)
Burgess R. Johnson, Honeywell Inc. (United States)
Robert G. Stockbridge, Air Force Research Lab. (United States)
Robert Lee Murrer Jr., Air Force Research Lab. (United States)
Eric M. Olson, Mission Research Corp. (United States)
Thomas P. Bergin, Mission Research Corp. (United States)
James R. Kircher, AEgis Technologies Group (United States)
David S. Flynn, Consultant for MacAulay Brown Inc. (United States)


Published in SPIE Proceedings Vol. 4027:
Technologies for Synthetic Environments: Hardware-in-the-Loop Testing V
Robert Lee Murrer Jr., Editor(s)

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