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Proceedings Paper

High-fidelity synthetic IR imaging model
Author(s): Michael Wegener; Richard Drake
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Paper Abstract

This paper describes a High Fidelity Synthetic IR Imaging Model which attempts to generate accurate static images as would be seen by a defined IR sensor given the target type and the atmospheric conditions. The model attempts to be quite general in its accommodation of physical processes yet maintain radiometric accuracy. Its main application are to assist in the validation of real-time IR scene generation software, and as a tool which can be used for range performance studies of electro-optical systems. The software model allows facet modeling of targets including temperature profiles and material properties. LOWTRAN/MODTRAN is used to provide atmospheric data for transmittance and self-radiation. Optical systems are described in terms of their transmittance and point spread function, both as functions of wavelength, and a self radiation term having temperature and material properties. At each wavelength desired the model generates descriptions of the flux distribution falling on the focal plane of the sensor system. The flux from different sources is added together to form the total flux distribution on the focal plane. Pixels on the focal plane are modeled by groups of facets with associated material properties allowing the shape and wavelength sensitivity to be expressed. The raw pixel output is obtained by integrating the flux distribution over the component facets and across wavelengths. Following non-uniformity modeling a convolution is applied which models readout smearing. Bandlimited noise is then added. The model is also able to generate and apply a matched filter to the output image. The model is designed to use common commercial software tools such as Multigen for target modeling and Open GL for the rendering. The model currently executes on Silicon Graphics hardware.

Paper Details

Date Published: 12 July 2000
PDF: 6 pages
Proc. SPIE 4027, Technologies for Synthetic Environments: Hardware-in-the-Loop Testing V, (12 July 2000); doi: 10.1117/12.391701
Show Author Affiliations
Michael Wegener, Defence Science and Technology Organisation (Australia)
Richard Drake, Acacia Research Pty. Ltd. (Australia)

Published in SPIE Proceedings Vol. 4027:
Technologies for Synthetic Environments: Hardware-in-the-Loop Testing V
Robert Lee Murrer Jr., Editor(s)

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