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Proceedings Paper

Advances in the universal programmable interface
Author(s): Douglas C. McKee
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Paper Abstract

Comptek Amherst Systems has been involved in the development of a Universal Programmable Interface (UPI) for use in hardware-in-the-loop (HWIL) testing of infrared/electro-optic (IR/EO) sensor systems. The UPI provides an interface between a scene generation system (SGS) and the unit under test (UUT) for either direct injection or optical projection. Unlike custom interfaces, the reconfigurable UPI supports a wide range of sensor systems. It was designed to simulate various sensor effects, emulate bypassed sensor components, and reformat the data for input to the UUT. This paper discusses the advances we have made in the past year on the UPI, including those in both hardware and software.

Paper Details

Date Published: 12 July 2000
PDF: 8 pages
Proc. SPIE 4027, Technologies for Synthetic Environments: Hardware-in-the-Loop Testing V, (12 July 2000); doi: 10.1117/12.391683
Show Author Affiliations
Douglas C. McKee, Comptek Amherst Systems, Inc. (United States)


Published in SPIE Proceedings Vol. 4027:
Technologies for Synthetic Environments: Hardware-in-the-Loop Testing V
Robert Lee Murrer Jr., Editor(s)

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