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Proceedings Paper

Optical design for testing and aligning lightweight grazing incidence x-ray mirrors
Author(s): William W. Zhang
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Paper Abstract

Test and alignment of light weight X-ray optics have been a challenge for two reasons: (1) that the intrinsic mirror quality and distortions caused by handling can not be easily separated, and (2) the diffraction limits of the visible light become a severe problem at the order of one arc- minute. Traditional methods of using a normal incident pencil or small parallel beam which monitors a tiny fraction of the mirror in question at a given time can not adequately monitor those distortions. We are developing a normal incidence setup that monitors a large fraction, if not the whole, of the mirror at any given time. It allow us to test and align thin X-ray mirrors to an accuracy of a few arc seconds or to a limit dominated by the mirror intrinsic quality.

Paper Details

Date Published: 18 July 2000
PDF: 8 pages
Proc. SPIE 4012, X-Ray Optics, Instruments, and Missions III, (18 July 2000); doi: 10.1117/12.391611
Show Author Affiliations
William W. Zhang, NASA Goddard Space Flight Ctr. (United States)

Published in SPIE Proceedings Vol. 4012:
X-Ray Optics, Instruments, and Missions III
Joachim E. Truemper; Bernd Aschenbach, Editor(s)

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