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Proceedings Paper

Grazing incidence optics for wide-field x-ray survey imaging: a comparison of optimization techniques
Author(s): Peter W. A. Roming; David N. Burrows; Gordon P. Garmire; Jared R. Shoemaker; William B. Roush
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Paper Abstract

Discussions of optimizing wide-field x-ray optics, with field-of-view less-than 1.1 degree-squared, have been made previously in the literature. However, very little has been published about the optimization of wide-field x-ray optics with larger field-of-views, which technology could greatly enhanced x-ray surveys. We have been working on the design of a wide-field (3.1 degree-squared field-of-view), short focal length (190.5 cm), grazing incidence mirror shell set, with a desired rms image spot size of 15 arcsec. The baseline design consists of Wolter 1 type mirror shells with polynomial perturbations applied to the baseline design. The overall optimization technique is to efficiently optimize the polynomial coefficients that directly influence the angular resolution, without stepping through the entire multi-dimensional coefficient space. We have investigated optimization techniques such as the downhill simplex method, fractional factorial, and response surface (including Box- Behnken and central composite) design. We have also investigated the use of neural networks, such as backpropagation, general regression, and group method of data handling neural networks. We report our findings to date.

Paper Details

Date Published: 18 July 2000
PDF: 11 pages
Proc. SPIE 4012, X-Ray Optics, Instruments, and Missions III, (18 July 2000); doi: 10.1117/12.391571
Show Author Affiliations
Peter W. A. Roming, The Pennsylvania State Univ. (United States)
David N. Burrows, The Pennsylvania State Univ. (United States)
Gordon P. Garmire, The Pennsylvania State Univ. (United States)
Jared R. Shoemaker, The Pennsylvania State Univ. (United States)
William B. Roush, The Pennsylvania State Univ. (United States)

Published in SPIE Proceedings Vol. 4012:
X-Ray Optics, Instruments, and Missions III
Joachim E. Truemper; Bernd Aschenbach, Editor(s)

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