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Proceedings Paper

Effect of microwave loss and device length on the linear characteristics of traveling-wave coplanar-waveguide electroabsorption modulator
Author(s): Soon-Chel Kong; Jeong-Hoon Lee; Seung-Jin Lee; Won-Sun Cho; Youn Sub Lim; Young-Wan Choi
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Paper Abstract

We study the effects of microwave loss and device length on the nonlinear characteristics of intensity modulation response in 1.55 micrometer traveling-wave coplanar waveguide InGaAsP bulk electro-absorption modulator. By using device length segmentation scheme optical transmission curve reflecting the change of the electro-absorption effects at each segmented position due to the microwave loss is obtained, and then the intermodulation distortion and spurious free dynamic range characteristics of RF signal are analyzed. Device length decreases Vb3, which is the bias voltage minimizing the third order and increases the third order intermodulation distortion (IMD3). On the other hand, microwave loss increases Vb3, and reduces IMD3.

Paper Details

Date Published: 14 July 2000
PDF: 9 pages
Proc. SPIE 3944, Physics and Simulation of Optoelectronic Devices VIII, (14 July 2000); doi: 10.1117/12.391404
Show Author Affiliations
Soon-Chel Kong, Chung-Ang Univ. (South Korea)
Jeong-Hoon Lee, Chung-Ang Univ. (South Korea)
Seung-Jin Lee, Chung-Ang Univ. (United States)
Won-Sun Cho, Chung-Ang Univ. (South Korea)
Youn Sub Lim, Chung-Ang Univ. (South Korea)
Young-Wan Choi, Chung-Ang Univ. (South Korea)

Published in SPIE Proceedings Vol. 3944:
Physics and Simulation of Optoelectronic Devices VIII
Rolf H. Binder; Peter Blood; Marek Osinski, Editor(s)

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