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Proceedings Paper

Automated spot-by-spot inspection of arbitrary curved dielectric structures for quality and process control
Author(s): Richard D. Hollinger; Vasundara V. Varadan; Anikumar R. Tellakula; K. A. Jose; Vijay K. Varadan
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Paper Abstract

A novel approach is presented for the nondestructive, non- contact and in-situ inspection of curved dielectric objects using a spot focused free space measurement system. The use of a focused antenna permits spot by spot plane wave illumination of approximately one-wavelength diameter spots on a curved body to facilitate near field scanning. Benchmarking measurements were made on curved Plexiglas and glass samples of convex-concave shape with different radii of curvature and the complex permittivities were computed from the measured transmission coefficients. Comparing the results with planar samples show that the curvature does not significantly affect the accuracy of the measured permittivity of cylindrical surfaces if the local radii of curvature are larger than the spot size. Applications of the computer controlled, automated system for characterizing surface resistivity, radome IPD and transmission efficiency as well as potential uses in quality and process control during the manufacture of complex structures will be addressed. Variation in material properties, trapped moisture, manufacturing defects, etc. can be identified and located with precision. The other benefit of this approach is the non-contact nature of the method, which permits measurement of solids and liquids in high/low temperature environments. The spot focused beam permits characterization of small or large samples.

Paper Details

Date Published: 6 July 2000
PDF: 8 pages
Proc. SPIE 4129, Subsurface Sensing Technologies and Applications II, (6 July 2000); doi: 10.1117/12.390635
Show Author Affiliations
Richard D. Hollinger, HVS Technologies, Inc. (United States)
Vasundara V. Varadan, HVS Technologies, Inc. and The Pennsylvania State Univ. (United States)
Anikumar R. Tellakula, HVS Technologies, Inc. (United States)
K. A. Jose, The Pennsylvania State Univ. (United States)
Vijay K. Varadan, HVS Technologies, Inc. and The Pennsylvania State Univ. (United States)

Published in SPIE Proceedings Vol. 4129:
Subsurface Sensing Technologies and Applications II
Cam Nguyen, Editor(s)

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