Proceedings Paper
Estimation of intrinsic stresses and elastic moduli in thin films| Format | Member Price | Non-Member Price |
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Paper Abstract
An approach is presented for the determination of the residual stresses and elastic moduli of particle systems resulting from computer simulations of particle or atomic deposition. The proposed technique is based on fundamental concepts of elasticity and is capable of capturing the variation of stresses and moduli as functions of position within the system. Application to a perfect FCC crystal and a simple particle system is demonstrated.
Paper Details
Date Published: 30 June 2000
PDF: 11 pages
Proc. SPIE 4097, Complex Mediums, (30 June 2000); doi: 10.1117/12.390587
Published in SPIE Proceedings Vol. 4097:
Complex Mediums
Akhlesh Lakhtakia; Werner S. Weiglhofer; Russell F. Messier, Editor(s)
PDF: 11 pages
Proc. SPIE 4097, Complex Mediums, (30 June 2000); doi: 10.1117/12.390587
Show Author Affiliations
Pedro C. Andia, The Pennsylvania State Univ. (United States)
Francesco Costanzo, The Pennsylvania State Univ. (United States)
Francesco Costanzo, The Pennsylvania State Univ. (United States)
Gary L. Gray, The Pennsylvania State Univ. (United States)
Published in SPIE Proceedings Vol. 4097:
Complex Mediums
Akhlesh Lakhtakia; Werner S. Weiglhofer; Russell F. Messier, Editor(s)
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