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Proceedings Paper

Two-photon optical-beam-induced current microscopy of indium gallium nitride light-emitting diodes
Author(s): Fu-Jen Kao; Mao-Kuo Huang; Yung-Shun Wang; Sheng-Lung Huang; Ming Kwei Lee; Chi-Kuang Sun; Ping Chin Cheng
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Paper Abstract

In this study, epilayers of packaged indium gallium nitride light emitting diodes (LED's) are characterized by optical beam induced current (OBIC) and photoluminescence laser scanning microscopy through two-photon excitation. OBIC reveals spatial and electrical characteristics of LED's which can not be distinguished by photoluminescence. When compared with single- photon OBIC, two-photon OBIC imaging not only exhibits superior image quality but also reveals more clearly the characteristics of the epilayers that are being focused on. The uniformity of these LED's OBIC images can also be related to their light emitting efficiency.

Paper Details

Date Published: 4 July 2000
PDF: 7 pages
Proc. SPIE 4082, Optical Sensing, Imaging, and Manipulation for Biological and Biomedical Applications, (4 July 2000); doi: 10.1117/12.390528
Show Author Affiliations
Fu-Jen Kao, National Sun Yat-sen Univ. (Taiwan)
Mao-Kuo Huang, National Sun Yat-sen Univ. (Taiwan)
Yung-Shun Wang, National Sun Yat-sen Univ. (Taiwan)
Sheng-Lung Huang, National Sun Yat-sen Univ. (Taiwan)
Ming Kwei Lee, National Sun Yat-sen Univ. (Taiwan)
Chi-Kuang Sun, National Taiwan Univ. (Taiwan)
Ping Chin Cheng, SUNY/Buffalo (United States)

Published in SPIE Proceedings Vol. 4082:
Optical Sensing, Imaging, and Manipulation for Biological and Biomedical Applications
Robert R. Alfano; Peng Pei Ho; Arthur E. T. Chiou, Editor(s)

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