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Proceedings Paper

Static tester for characterization of optical near-field coupling phenomena
Author(s): Ferry Zijp; Yourii V. Martynov
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Paper Abstract

We present an experimental set-up for systematical studies of optical near-field coupling phenomena using a solid immersion lens (SIL) to surpass the conventional far field diffraction limit. The set-up incorporates a microscope objective lens with NA equals 0.80 in combination with a hemispherical SIL manufactured from glass with refractive index n equals 1.887 and a laser with a wavelength of 430 nm. Test samples are positioned within the evanescent decay distance from the bottom surface of the SIL using a closed- loop-controlled piezo actuator. The laser spot can be scanned over the sample enabling a study of the push-pull signal of pregrooved samples on a split photodiode. The intensity distribution and polarization state of the light reflected from the sample in the exit pupil of the microscope objective lens is studied on a CCD camera. The reflected light can be combined with a reference beam into an interferogram used for alignment purposes. We present measurements of evanescent coupling of light to a glass sample and the push-pull signal of a reflective phase grating with a groove pitch of 300 nm as a function of thickness of the air gap between de SIL and the sample. The evanescent coupling to a glass sample can accurately be described by thin-film optics theory. Experiments show that the push-pull signal amplitude depends on the polarization state of the irradiating beam.

Paper Details

Date Published: 6 July 2000
PDF: 7 pages
Proc. SPIE 4081, Optical Storage and Optical Information Processing, (6 July 2000); doi: 10.1117/12.390508
Show Author Affiliations
Ferry Zijp, Philips Research Labs. (Netherlands)
Yourii V. Martynov, Philips Research Labs. (Netherlands)

Published in SPIE Proceedings Vol. 4081:
Optical Storage and Optical Information Processing
Han-Ping D. Shieh; Tomas D. Milster, Editor(s)

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