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Proceedings Paper

Planar optics three-telescope beam combiners for astronomical interferometry
Author(s): Pierre Haguenauer; Marco Severi; Isabelle Schanen-Duport; Karine Perraut-Rousselet; Jean-Philippe Berger; Yann Duchene; Matthieu Lacolle; Pierre Y. Kern; Fabien Malbet; Pierre Benech
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Paper Abstract

Planar optics technologies allow to design complex single- mode interferometric beam combiners on single miniaturized optical components. Our current collaborations with laboratories and companies allow us to deeply investigate the characteristics of components produced either by silica etching (LETI/CEA technology) or by ion diffusion process (LEMO/ENSERG and GeeO technology). Based on excellent results with 2-telescope beam combiners in the near infrared band (atmospheric H band), the extension to three telescopes has been achieved with both technologies and different combination configurations (co-axial and multi-axial). The specific application of astronomical interferometry requires the full characterization of such components in term of global throughput, identification of photon losses, polarization maintaining properties, interferometric behavior in monochromatic and polychromatic cases.

Paper Details

Date Published: 5 July 2000
PDF: 9 pages
Proc. SPIE 4006, Interferometry in Optical Astronomy, (5 July 2000); doi: 10.1117/12.390193
Show Author Affiliations
Pierre Haguenauer, Observatoire de Grenoble (France) and Capteurs et Systemes Optiques de Mesures (France)
Marco Severi, CEA-LETI (France)
Isabelle Schanen-Duport, Ecole Nationale Superieure d'Electronique et de Radioelectricite de Grenoble (France)
Karine Perraut-Rousselet, Observatoire de Grenoble (France)
Jean-Philippe Berger, Ecole Nationale Superieure d'Electronique et de Radioelectricite de Grenoble (United States)
Yann Duchene, Observatoire de Grenoble (France)
Matthieu Lacolle, Observatoire de Grenoble (France)
Pierre Y. Kern, Observatoire de Grenoble (France)
Fabien Malbet, Observatoire de Grenoble (France)
Pierre Benech, Ecole Nationale Superieure d'Electronique et de Radioelectricite de Grenoble (France)


Published in SPIE Proceedings Vol. 4006:
Interferometry in Optical Astronomy
Pierre J. Lena; Andreas Quirrenbach, Editor(s)

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