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Proceedings Paper

Demonstration of nanometer-level active metrology for long-range interferometric displacement measurements
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Paper Abstract

We report on the laboratory demonstration of an active linear metrology scheme using two separate lasers. In `active' metrology, the passive retroreflector in one arm of a typical heterodyne interferometer is replaced with an active optical transponder. The Transponder can dramatically boost the returned signal strength, thereby providing a way to perform metrology and pathlength control over long (> km) distances. Two Lightwave Electronics non-planar ring oscillator lasers at a wavelength of 1.319 micrometers were used as the Source and Transponder. The frequency of the Transponder is offset locked to the signal received from the Source using the Lightwave Laser Offset Locking Accessory, and the Transponder beam is sent back to the Source. The phases of the beat signals are measured locally at the Source and Transponder by appropriately demodulating the signal, and post-processed to determine displacement. In initial experiments, the standard deviation of the measurement errors was less than three nanometers.

Paper Details

Date Published: 5 July 2000
PDF: 9 pages
Proc. SPIE 4006, Interferometry in Optical Astronomy, (5 July 2000); doi: 10.1117/12.390165
Show Author Affiliations
Muthu Jeganathan, Jet Propulsion Lab. (United States)
Serge Dubovitsky, Jet Propulsion Lab. (United States)

Published in SPIE Proceedings Vol. 4006:
Interferometry in Optical Astronomy
Pierre J. Lena; Andreas Quirrenbach, Editor(s)

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