Share Email Print
cover

Proceedings Paper

157-nm lithography simulation using a finite-difference time-domain method with oblique incidence in a multilayered medium
Author(s): Michael S. Yeung; Eytan Barouch; Clifford A. Martin; James A. McClay
Format Member Price Non-Member Price
PDF $17.00 $21.00

Paper Abstract

A Huygens surface excitation technique suitable for FDTD computation of electromagnetic scattering from photomask apertures embedded in layered dispersive substrates is presented. The technique is based on the decomposition of an arbitrary incident wave into its frequency components and computing the corresponding steady-state fields in the FDTD space analytically. The technique allows the effects of oblique incidence in partially coherent imaging to be taken into account rigorously in the electromagnetic computation. Numerical results for partially coherent aerial images in 157-nm lithography show that there is an approximately 20 percent difference between the aerial image intensity computed by FDTD and that computed by using the Kirchhoff approximation. This difference can in part be attributed to energy dissipation in the lossy chromium layer through which the photomask apertures are etched.

Paper Details

Date Published: 5 July 2000
PDF: 10 pages
Proc. SPIE 4000, Optical Microlithography XIII, (5 July 2000); doi: 10.1117/12.389063
Show Author Affiliations
Michael S. Yeung, Boston Univ. (United States)
Eytan Barouch, Boston Univ. (United States)
Clifford A. Martin, SVG Lithography Systems, Inc. (United States)
James A. McClay, SVG Lithography Systems, Inc. (United States)


Published in SPIE Proceedings Vol. 4000:
Optical Microlithography XIII
Christopher J. Progler, Editor(s)

© SPIE. Terms of Use
Back to Top
PREMIUM CONTENT
Sign in to read the full article
Create a free SPIE account to get access to
premium articles and original research
Forgot your username?
close_icon_gray