Share Email Print

Proceedings Paper

Phase-shifting method for two-dimensional birefringence measurement with return-path beams
Format Member Price Non-Member Price
PDF $17.00 $21.00

Paper Abstract

The paper describes the phase-shifting method for measuring 2D birefringence distributions with return-path polarimeter scheme. Eight or sixteen images in polarized light are processed for determining of specimen's retardance and azimuth distributions. The principal formulas that describe the mathematical processing are presented. The method allows us to find the image of specimen's birefringence with nonuniform distribution of fast axis azimuth and retardance. The method gives the exact solution for any retardance value. Approximation equations for determining of small retardance are presented. The measurement method is highly effective for research of vector or tensor physical fields, which are accompanied by birefringence. For example, inner stresses, electrical and magnetic fields, heat flows, birefringence liquid flows et al.

Paper Details

Date Published: 14 June 2000
PDF: 7 pages
Proc. SPIE 4148, Optoelectronic and Hybrid Optical/Digital Systems for Image and Signal Processing, (14 June 2000); doi: 10.1117/12.388464
Show Author Affiliations
Michael I. Shribak, Heat and Mass Transfer Institute (United States)
Yukitoshi Otani, Tokyo Univ. of Agriculture and Technology (Japan)
Toru Yoshizawa, Tokyo Univ. of Agriculture and Technology (Japan)

Published in SPIE Proceedings Vol. 4148:
Optoelectronic and Hybrid Optical/Digital Systems for Image and Signal Processing
Simon B. Gurevich; Zinovii T. Nazarchuk; Leonid I. Muravsky, Editor(s)

© SPIE. Terms of Use
Back to Top
Sign in to read the full article
Create a free SPIE account to get access to
premium articles and original research
Forgot your username?