
Proceedings Paper
Whole-field mapping in polarization studies by use of null polarimetryFormat | Member Price | Non-Member Price |
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Paper Abstract
In this paper we describe whole-field polarimetric technique, which exploits principles of null-scheme and extends them to whole-field mapping of the measured parameters. Operational principles of the method and the instrument configuration are presented. As any other null- arrangement, the technique is based on finding a set of azimuth angles for the elements, which comprise the polarimeter, such that the light flux falling on the detector is extinguished. A detailed description of measurement procedure with the peculiarities of whole-field exploitation mode is suggested. Theoretical considerations are supplemented with the measurement examples.
Paper Details
Date Published: 14 June 2000
PDF: 7 pages
Proc. SPIE 4148, Optoelectronic and Hybrid Optical/Digital Systems for Image and Signal Processing, (14 June 2000); doi: 10.1117/12.388447
Published in SPIE Proceedings Vol. 4148:
Optoelectronic and Hybrid Optical/Digital Systems for Image and Signal Processing
Simon B. Gurevich; Zinovii T. Nazarchuk; Leonid I. Muravsky, Editor(s)
PDF: 7 pages
Proc. SPIE 4148, Optoelectronic and Hybrid Optical/Digital Systems for Image and Signal Processing, (14 June 2000); doi: 10.1117/12.388447
Show Author Affiliations
O. M. Krupych, Institute for Physical Optics (Ukraine)
S. Y. Berezhna, Institute for Physical Optics (Ukraine)
S. Y. Berezhna, Institute for Physical Optics (Ukraine)
I. V. Berezhnyi, Institute for Physical Optics (Ukraine)
Masahisa Takashi, Aoyama Gakuin Univ. (Japan)
Masahisa Takashi, Aoyama Gakuin Univ. (Japan)
Published in SPIE Proceedings Vol. 4148:
Optoelectronic and Hybrid Optical/Digital Systems for Image and Signal Processing
Simon B. Gurevich; Zinovii T. Nazarchuk; Leonid I. Muravsky, Editor(s)
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