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Proceedings Paper

Studies of phase retardation plates with universal null polarimeter
Author(s): Oleg S. Kushnir; O. S. Dzendzelyuk; V. A. Grabovski; V. B. Mikhailik
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Paper Abstract

The high-accuracy polarimetric technique for testing the retardation and the other parameters of phase retardation plates is described. It is based on the so-called universal null-polarimeter for crystal optical studies and represents an improved version of the method developed earlier by the authors. The influence of optical activity, dichroism and multiple reflection effects on the final data is analyzed. The experimental results on several commercial retardation plates made from quartz and lithium niobate are reported.

Paper Details

Date Published: 14 June 2000
PDF: 10 pages
Proc. SPIE 4148, Optoelectronic and Hybrid Optical/Digital Systems for Image and Signal Processing, (14 June 2000); doi: 10.1117/12.388436
Show Author Affiliations
Oleg S. Kushnir, Lviv State Univ. (Ukraine)
O. S. Dzendzelyuk, Lviv State Univ. (Ukraine)
V. A. Grabovski, Lviv State Univ. (Ukraine)
V. B. Mikhailik, Lviv State Univ. (Ukraine)

Published in SPIE Proceedings Vol. 4148:
Optoelectronic and Hybrid Optical/Digital Systems for Image and Signal Processing
Simon B. Gurevich; Zinovii T. Nazarchuk; Leonid I. Muravsky, Editor(s)

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